Title :
Uncertainty Analysis of V-Band on-Wafer Noise Parameter Measurement System
Author_Institution :
MilliLab, VTT Information Technology, P.O.Box 1202, FIN-02044 VTT, Finland. e-mail: manu.lahdes@vtt.fi
Abstract :
A V-band on-wafer noise parameter measurement system and method are presented. Monte-Carlo analysis is used to detennine the uncertainty of the measured noise parameters. The uncertainty budget and measurement results ofan InP HEMT between 58-62 GHz are shown.
Keywords :
Acoustic reflection; Calibration; Guidelines; Measurement uncertainty; Noise figure; Noise measurement; Power measurement; Scattering parameters; Switches; Tuners;
Conference_Titel :
Microwave Conference, 1998. 28th European
Conference_Location :
Amsterdam, Netherlands
DOI :
10.1109/EUMA.1998.338030
