• DocumentCode
    2140026
  • Title

    The evolution of plastic deformation of Sn3.5Ag-based lead-free solders

  • Author

    Gao, F. ; Takemoto, T.

  • Author_Institution
    Joining & Welding Res. Inst., Osaka Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Small amount of additives, namely, 0.2Co + 0.1Ni, were doped into the Sn3.5Ag solder matrix which has been considered as one of the most promising candidates to replace the conventional Sn-Pb solders. The mechanical properties of the lead-free solders were assessed from the force-penetration curves measured by nanoindentation testing. These mechanical properties were then used as the input parameters in the simulation based on the Dao´s method. In the meantime, the rate sensitivity value in the constitutive model, say sigma = Amiddotepsivdotm for the lead-free solders were also determined by the variable tensile speed methodology. The creep deformation of both solders is the function of the loading rate. The creep deformation behavior during nanoindentation testing at dwell time for Sn3.5Ag0.2Co0.1Ni solder seemed more severe than that for Sn3.5Ag solder. The pile-up phenomenon was more remarkable for Sn3.5Ag0.2Co0.1Ni solder. The simulated plastic deformation under indentation showed that the greatest plastic deformation was beneath the indentation tips for both of the solders. And the plastic deformation zone for Sn3.5Ag was slightly greater
  • Keywords
    alloying additions; cobalt alloys; creep fracture; hardness testing; indentation; nickel alloys; plastic deformation; silver alloys; solders; tin alloys; SnAgCoNi; creep deformation; force-penetration curves; lead-free solders; mechanical properties; nanoindentation testing; plastic deformation; variable tensile speed methodology; Additives; Creep; Deformable models; Environmentally friendly manufacturing techniques; Force measurement; Lead; Mechanical factors; Mechanical variables measurement; Plastics; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645658
  • Filename
    1645658