Abstract :
The following topics are dealt with: static analysis; embedded systems; mobile platforms; defects; security; clones and effort-based transformation.
Keywords :
embedded systems; mobile computing; program diagnostics; security of data; defects; effort-based transformation; embedded systems; mobile platforms; security; static analysis;
Conference_Titel :
Source Code Analysis and Manipulation (SCAM), 2011 11th IEEE International Working Conference on
Conference_Location :
Williamsburg, VI
Print_ISBN :
978-1-4577-0932-6
DOI :
10.1109/SCAM.2011.33
