DocumentCode :
2140189
Title :
A novel "SMAFTI" package for inter-chip wide-band data transfer
Author :
Kurita, Yoichiro ; Soejima, Koji ; Kikuchi, Katsumi ; Takahashi, Masatake ; Tago, Masamoto ; Koike, Masahiro ; Shibuya, Koujirou ; Yamamichi, Shintaro ; Kawano, Masaya
Author_Institution :
NEC Electron. Corp., Kanagawa
fYear :
0
fDate :
0-0 0
Abstract :
A package structure with inter-chip connection is proposed for broadband data transfer and low latency electrical communication between a high-capacity memory and a logic device interconnected by a feedthrough interposer (FTI) featuring a fine-wiring pattern and ultra-fine-pitch through vias. The FTI is formed on a silicon wafer using a photolithography process to realize fine vias and fine wiring patterns. This structure enables over a thousand inter-chip connections and a high pin count in the logic device. This paper describes the concept, structure, process, and experimental results of prototypes of this package called SMAFTI (SMArt chip connection with FeedThrough Interposer). This paper also reports the results of intermetallic compound analysis and thermal cycle test (TCT) that were performed to confirm the fundamental reliability of this novel inter-chip connection structure
Keywords :
fine-pitch technology; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; photolithography; FTI; SMAFTI package; TCT; broadband data transfer; feedthrough interposer; fine-wiring pattern; high-capacity memory; integrated circuit reliability; inter-chip data transfer; intermetallic compound analysis; logic device interconnection; low latency electrical communication; photolithography process; silicon wafer; smart chip connection; thermal cycle test; ultra-fine-pitch; vias; wide-band data transfer; Delay; Intermetallic; Lithography; Logic devices; Packaging; Performance analysis; Prototypes; Silicon; Wideband; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645661
Filename :
1645661
Link To Document :
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