DocumentCode :
2140225
Title :
Integral relations for bipolar transistor modelling-rigorous results
Author :
Reisch, M.
Author_Institution :
Siemens AG, Munchen, West Germany
fYear :
1988
fDate :
11-14 Dec. 1988
Firstpage :
126
Lastpage :
129
Abstract :
It is shown how current-spreading, current-driven generalization/recombination phenomena, transient effects, and series-resistance effects can rigorously be considered within integral relations characterizing bipolar transistor behavior such as H.K. Grummel´s (1970) integral charge control relation. The proposed approach applies concepts that reestablish a vanishing divergence of the transfer current and allows the derivation of consistent, closed-form expressors for the base and collector current of a three-dimensional BJT (bipolar junction transistor) of arbitrary geometry. The approach provides in particular a rigorous definition of electron current transit time in terms of AC quantities that reduces to the quasistatic definition in the limit as omega approaches 0.<>
Keywords :
bipolar transistors; semiconductor device models; Grummel integral charge control relation; base current; bipolar junction transistor; bipolar transistor modelling; closed-form expressors; collector current; current-driven generalization/recombination phenomena; current-spreading; electron current transit time; integral relations; series-resistance effects; transfer current; transient effects; Analytical models; Bipolar transistors; Character generation; Electron emission; Geometry; Integral equations; Laboratories; Microelectronics; Research and development; Spontaneous emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1988.32769
Filename :
32769
Link To Document :
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