• DocumentCode
    2140941
  • Title

    Coping with uncertainty in FPGA architecture design

  • Author

    Ratchev, Boris ; Mutton, M. ; Mendel, David

  • Author_Institution
    Altera Corp., San Jose, CA, USA
  • fYear
    2005
  • fDate
    24-26 Aug. 2005
  • Firstpage
    662
  • Lastpage
    665
  • Abstract
    The design of FPGA architectures involves optimization of area, delay, power and routability across hundreds of architectural choices (e.g. LUT size, wire length, flexibility and circuit sizing). Since the difficulty of defining and predicting the design space only grows as we approach 65nm and 45nm processes it is necessary to have a better understanding of uncertainty in the architecture definition. In this paper we look at the sources of uncertainty, describe current unpublished methods for encapsulating error and uncertainty in experiments, and propose new methodologies involving ad-hoc, analytic and Monte Carlo simulation techniques to manage these risks in the future.
  • Keywords
    Monte Carlo methods; field programmable gate arrays; logic design; 45 nm; 65 nm; FPGA architecture design; LUT size; Monte Carlo simulation; circuit sizing; wire length; Design optimization; Field programmable gate arrays; Proposals; Prototypes; Switches; Table lookup; Technological innovation; Timing; Uncertainty; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications, 2005. International Conference on
  • Print_ISBN
    0-7803-9362-7
  • Type

    conf

  • DOI
    10.1109/FPL.2005.1515808
  • Filename
    1515808