DocumentCode
2141053
Title
Reworkable no-flow underfilling for both tin-lead and lead-free reflows for CSP assembled under air
Author
Yin, Wusheng ; Lee, Ning-Cheng
Author_Institution
Indium Corp. of America, Clinton, NY
fYear
0
fDate
0-0 0
Abstract
Two novel no-flow underfill materials, NF220 for SnPb and NF260 for Pb-free, were developed and evaluated for CSP reliability enhancement applications. Results indicate these materials exhibit outstanding performance on yield and reliability, with both temperature cycling and drop test performance being one order of magnitude greater than current industry practices. In particular, those novel materials exhibit very wide processing windows, as reflected by their great tolerance toward variation in volume and pattern of underfill dispensed, humidity, reflow window, thermal aging, and a variety of surface finishes, accordingly can be easily utilized for double-sided reflow under air for a wide variety of surface finishes. Most noteworthily, these no-flow underfills are easily reworkable, thus further promise reduction of manufacturing cost
Keywords
ageing; chip scale packaging; lead alloys; reflow soldering; reliability; solders; surface mount technology; tin alloys; CSP assembly; NF220; NF260; SMT; SnPb; humidity; lead-free reflows; manufacturing cost; no-flow underfill materials; reflow window; reliability enhancement; reworkable no-flow underfilling; solders; thermal aging; tin-lead reflows; Assembly; Bonding; Chip scale packaging; Costs; Electric shock; Environmentally friendly manufacturing techniques; Lead; Materials reliability; Materials testing; Surface-mount technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
1-4244-0152-6
Type
conf
DOI
10.1109/ECTC.2006.1645694
Filename
1645694
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