• DocumentCode
    2141053
  • Title

    Reworkable no-flow underfilling for both tin-lead and lead-free reflows for CSP assembled under air

  • Author

    Yin, Wusheng ; Lee, Ning-Cheng

  • Author_Institution
    Indium Corp. of America, Clinton, NY
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Two novel no-flow underfill materials, NF220 for SnPb and NF260 for Pb-free, were developed and evaluated for CSP reliability enhancement applications. Results indicate these materials exhibit outstanding performance on yield and reliability, with both temperature cycling and drop test performance being one order of magnitude greater than current industry practices. In particular, those novel materials exhibit very wide processing windows, as reflected by their great tolerance toward variation in volume and pattern of underfill dispensed, humidity, reflow window, thermal aging, and a variety of surface finishes, accordingly can be easily utilized for double-sided reflow under air for a wide variety of surface finishes. Most noteworthily, these no-flow underfills are easily reworkable, thus further promise reduction of manufacturing cost
  • Keywords
    ageing; chip scale packaging; lead alloys; reflow soldering; reliability; solders; surface mount technology; tin alloys; CSP assembly; NF220; NF260; SMT; SnPb; humidity; lead-free reflows; manufacturing cost; no-flow underfill materials; reflow window; reliability enhancement; reworkable no-flow underfilling; solders; thermal aging; tin-lead reflows; Assembly; Bonding; Chip scale packaging; Costs; Electric shock; Environmentally friendly manufacturing techniques; Lead; Materials reliability; Materials testing; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645694
  • Filename
    1645694