Title :
Reworkable no-flow underfilling for both tin-lead and lead-free reflows for CSP assembled under air
Author :
Yin, Wusheng ; Lee, Ning-Cheng
Author_Institution :
Indium Corp. of America, Clinton, NY
Abstract :
Two novel no-flow underfill materials, NF220 for SnPb and NF260 for Pb-free, were developed and evaluated for CSP reliability enhancement applications. Results indicate these materials exhibit outstanding performance on yield and reliability, with both temperature cycling and drop test performance being one order of magnitude greater than current industry practices. In particular, those novel materials exhibit very wide processing windows, as reflected by their great tolerance toward variation in volume and pattern of underfill dispensed, humidity, reflow window, thermal aging, and a variety of surface finishes, accordingly can be easily utilized for double-sided reflow under air for a wide variety of surface finishes. Most noteworthily, these no-flow underfills are easily reworkable, thus further promise reduction of manufacturing cost
Keywords :
ageing; chip scale packaging; lead alloys; reflow soldering; reliability; solders; surface mount technology; tin alloys; CSP assembly; NF220; NF260; SMT; SnPb; humidity; lead-free reflows; manufacturing cost; no-flow underfill materials; reflow window; reliability enhancement; reworkable no-flow underfilling; solders; thermal aging; tin-lead reflows; Assembly; Bonding; Chip scale packaging; Costs; Electric shock; Environmentally friendly manufacturing techniques; Lead; Materials reliability; Materials testing; Surface-mount technology;
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0152-6
DOI :
10.1109/ECTC.2006.1645694