• DocumentCode
    2141133
  • Title

    Fault scanner for reconfigurable logic

  • Author

    Shnidman, Nathan R. ; Mangione-Smith, William H. ; Potkonjak, Miodrag

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • fYear
    1997
  • fDate
    15-16 Sep 1997
  • Firstpage
    238
  • Lastpage
    255
  • Abstract
    We propose a technique for online built-in self-test of Field Programmable Gate Arrays (FPGAs). The goal of this system is to detect deviations from the intended functionality of an FPGA without using special-purpose hardware, hardware external to the device, and without interrupting system operation. A system that solves these problems would be useful for mission-critical applications with resource constraints. We present here a fault detection system which solves these problems through an online fault scanning methodology. Resources internal to the device are configured to test for faults. Testing scans across an FPGA, checking a section at a time. The viability and effectiveness of such a system is supported through simulation of the system on a model FPGA
  • Keywords
    automatic testing; built-in self test; fault location; field programmable gate arrays; integrated circuit testing; logic testing; FPGA testing; built-in self-test; fault detection system; fault scanner; mission-critical applications; online BIST; online fault scanning methodology; reconfigurable logic; resource constraints; Computer science; Fault detection; Field programmable gate arrays; Hardware; Impedance; Monitoring; Performance evaluation; Programmable logic arrays; Reconfigurable logic; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Research in VLSI, 1997. Proceedings., Seventeenth Conference on
  • Conference_Location
    Ann Arbor, MI
  • Print_ISBN
    0-8186-7913-1
  • Type

    conf

  • DOI
    10.1109/ARVLSI.1997.634857
  • Filename
    634857