Title :
Internal field distribution measurements of PCB insulation layers
Author :
Fukunaga, K. ; Maeno, T. ; Okamoto, K.
Author_Institution :
National Inst. of Inf. & Commun. Technol., Tokyo
Abstract :
Dielectric properties inside the insulation layer has become important in the case of multi-layer and embedded printed circuit boards. We observed internal charge and electric field profiles of insulation layers and found that the internal electric field profile formed by the applied electric field and ion impurities depends on the internal configuration of composites
Keywords :
dielectric properties; electric field measurement; impurities; insulation; printed circuit testing; PCB insulation layers; dielectric properties; embedded printed circuit boards; internal electric field profile; internal field distribution measurements; ion impurities; multilayer printed circuit boards; Acoustic pulses; Aging; Dielectric losses; Dielectric measurements; Dielectrics and electrical insulation; Monitoring; Printed circuits; Pulsed electroacoustic methods; Space charge; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0152-6
DOI :
10.1109/ECTC.2006.1645709
