• DocumentCode
    2141525
  • Title

    Silicon nanowire CMOSFETs : Fabrication, characteristics, and memory application

  • Author

    Park, Donggun

  • Author_Institution
    Memory Div., Samsung Electron. Co., Hwasung, South Korea
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    Continuous device scaling has led to the development of various transistors such as Ultra-Thin-Body SOI MOSFET, FinFET, and gate all around (GAA) MOSFETs . As the device shrinks further, the ultimate MOSFET structure would be GAA nanowire MOSFET with a fully depleted channel thoroughly controlled by the gate electrode. In this paper, fabrication processes of silicon nanowire MOSFETs on bulk Si using top-down method, their characteristics including 1D and quantum dot characteristics will be reported. Also applicable examples to memory devices such as SRAM and NAND Flash will be demonstrated.
  • Keywords
    CMOS integrated circuits; MOSFET; elemental semiconductors; nanoelectronics; nanowires; semiconductor quantum dots; semiconductor storage; silicon; 1D characteristics; CMOSFET; FinFET; NAND flash; SRAM; Si; memory devices; quantum dot; silicon nanowire MOSFET; top-down method; ultrathin-body SOI MOSFET; CMOSFETs; Electrodes; Fabrication; FinFETs; MOSFET circuits; Nanoscale devices; Quantum dots; Random access memory; Silicon; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734467
  • Filename
    4734467