• DocumentCode
    2141914
  • Title

    Temperature dependent EM performance predictions of dielectric slab based on inhomogeneous planar layer model

  • Author

    Nair, P.R.U. ; Jha, R.M.

  • Author_Institution
    Comput. Electromagn. Lab., CSIR-Nat. Aerosp. Labs., Bangalore, India
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    During flight operations, the dielectric properties of the wall of airborne dielectric structure (like radomes, coatings etc.) vary due to large temperature gradient existing across the wall. Such dielectric walls can be modeled as inhomogeneous structures consisting of stacked layers of dielectric materials with varying dielectric parameters. The present work is focused on the temperature dependent EM performance predictions of above mentioned dielectric walls based on inhomogeneous planar layer (IPL) model using equivalent transmission line method. The material considered is an alloy of silicon nitride (Si3N4), a promising aerospace material with excellent temperature resistance, dielectric and mechanical properties.
  • Keywords
    dielectric materials; electromagnetic field theory; inhomogeneous media; nitrogen; permittivity; silicon alloys; transmission lines; walls; IPL model; Si3N4; aerospace material; airborne dielectric structure; dielectric materials; dielectric parameters; dielectric properties; dielectric slab; dielectric walls; equivalent transmission line method; inhomogeneous planar layer model; inhomogeneous structures; mechanical properties; stacked layers; temperature dependent EM performance predictions; temperature gradient; temperature resistance; variable permittivity; Atmospheric modeling; Dielectrics; Predictive models; Reflection; Slabs; Temperature; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6348597
  • Filename
    6348597