DocumentCode :
2141938
Title :
Vanadium oxide thermal microprobes for nanocalorimetry
Author :
De Bruyker, Dirk ; Recht, Michael I. ; Torres, Frank E. ; Bell, Alan G. ; Bruce, Richard H.
Author_Institution :
Palo Alto Res. Center (PARC), Palo Alto, CA, USA
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
2358
Lastpage :
2362
Abstract :
Highly sensitive thermal microprobes are presented, consisting of curved cantilevers with vanadium oxide thermistors located at their tips. The cantilevers are realized by stress-engineered metal thin films and the thermistors consist of reactively sputter-deposited vanadium pentoxide. The thermistors are electrically contacted through the stressed metal layer, and at the same time thermally insulated from the substrate due to the relatively small thickness and large length of the cantilevers. We propose to apply these novel thermal microprobes in a nanocalorimetry system, in order to lower the cost and increase the sensitivity of the measurements.
Keywords :
calorimetry; cantilevers; metallic thin films; vanadium compounds; VO2; curved cantilevers; high sensitive thermal microprobes; nanocalorimetry system; reactive sputter-deposited vanadium pentoxide; stress-engineered metal thin films; thermistors; vanadium oxide thermal microprobes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5690948
Filename :
5690948
Link To Document :
بازگشت