Title :
Electrical noise characteristics of a doped silicon microcantilever heater-thermometer
Author :
Corbin, Elise A. ; King, William P.
Author_Institution :
Dept. of Mech. Sci. & Eng., Univ. of Illinois Urbana-Champaign, Urbana, IL, USA
Abstract :
We report measurements of the electronic noise characteristics of doped silicon microcantilever heater-thermometers. The noise floor is measured over the range 1 Hz - 12 kHz while the cantilever is resistively heated over the temperature range of 297 - 615 K. At low frequency 1/f, or flicker, noise is the dominant noise type, while at high frequency the Johnson, or thermal, noise dominates. The Johnson noise floor is found to be less than 10 nV / Hz1/2, which corresponds to a cantilever temperature precision of about 2 - 30 μK / Hz1/2 over the temperature range measured. To our knowledge, this paper reports the first detailed measurements of noise in a heated microcantilever sensor.
Keywords :
cantilevers; microsensors; thermometers; Johnson noise floor; doped silicon microcantilever; electrical noise characteristics; frequency 1 Hz to 12 kHz; heated microcantilever sensor; heater-thermometer; low frequency; temperature 297 K to 615 K; temperature range;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5690952