Title :
Combining RAM technologies for hard-error recovery in L1 data caches working at very-low power modes
Author :
Lorente, Vicente ; Valero, Alejandro ; Sahuquillo, Julio ; Petit, Salvador ; Canal, Ramon ; Lopez, Pedro ; Duato, Jose
Author_Institution :
Department of Computer Engineering, Universitat Politècnica de València, Spain
Abstract :
Low-power modes in modern microprocessors rely on low frequencies and low voltages to reduce the energy budget. Nevertheless, manufacturing induced parameter variations can make SRAM cells unreliable producing hard errors at supply voltages below Vccmin.
Keywords :
Arrays; Capacitance; Capacitors; Program processors; Proposals; SRAM cells;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.031
