Title :
Implementing self-testing and self-repairable analog circuits on field programmable analog array platforms
Author :
Mudhireddy, Venkata Naresh ; Ramamoorthy, Sarvanan ; Wang, Haibo
Author_Institution :
Southern Illinois Univ., Carbondale, IL, USA
Abstract :
This paper presents a methodology and experiments on implementing self-healing analog circuits on a hardware platform that consists of microcontroller, flash memory, and a switched-capacitor based field programmable analog array (FPAA) device. By taking advantage of FPAA programmability and the availability of redundant resources, the microcontroller programs the FPAA circuit into different circuit configurations to perform online testing. The microcontroller also monitors the online testing data to determine if circuit faults occur. Once a circuit fault is detected, the FPAA circuit will be reconfigured to replace the faulty circuit block by a redundant resource to achieve self-healing. Experiments results are presented to show the effectiveness of the fault detection method and demonstrate the feasibility of self-healing operations.
Keywords :
analogue circuits; circuit testing; field programmable analogue arrays; flash memories; microcontrollers; switched capacitor networks; FPAA; field programmable analog array platforms; flash memory; microcontrollers; self-repairable analog circuits; self-testing circuits; switched-capacitor; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Field programmable analog arrays; Flash memory; Hardware; Microcontrollers; Switching circuits;
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-6454-8
DOI :
10.1109/ISQED.2010.5450395