DocumentCode
2142498
Title
A template alignment algorithm for question classification
Author
Sung, Cheng-Lung ; Day, Min-Yuh ; Yen, Hsu-Chun ; Hsu, Wen-Lian
Author_Institution
Electr. Eng. Dept., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
17-20 June 2008
Firstpage
197
Lastpage
199
Abstract
Question classification (QC) plays a key role in automated question answering (QA) systems. In Chinese QC, for example, a question is analyzed and then labeled with the question type it belongs to and the expected answer type. In this paper, we propose a novel method of Chinese QC that integrates syntactic tags and semantic tags into an alignment-based approach. We adopt a template alignment (TA) algorithm to process large collections of Chinese questions and compare the classification results with those of INFOMAP, a human annotated knowledge inference engine for Chinese questions. We experimented with two approaches for the proposed system: a majority algorithm and a machine learning method that uses Support Vector Machine (SVM). The TA algorithm performs well with both approaches. The experimental results show that the accuracy achieved by TA (85.5%) is comparable to that of INFOMAP (88%). In contrast, QC based on the SVM approach, which incorporates syntactic features and TA yields an accuracy rate of 91.5%.
Keywords
information retrieval; learning (artificial intelligence); pattern classification; support vector machines; Chinese question classification; automated question answering system; human annotated knowledge inference engine; machine learning method; support vector machine; syntactic-semantic tag; template alignment algorithm; Algorithm design and analysis; Artificial intelligence; Classification algorithms; Electronic mail; Inference algorithms; Information analysis; Internet; Machine learning algorithms; Statistical analysis; Uniform resource locators; Alignment; Document Classification; Surface Pattern; Text Mining;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligence and Security Informatics, 2008. ISI 2008. IEEE International Conference on
Conference_Location
Taipei
Print_ISBN
978-1-4244-2414-6
Electronic_ISBN
978-1-4244-2415-3
Type
conf
DOI
10.1109/ISI.2008.4565055
Filename
4565055
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