DocumentCode :
2142529
Title :
Towards a Formal Framework for Product Line Test Development
Author :
Kang, Sungwon ; Lee, Jihyun ; Kim, Myungchul ; Lee, Woojin
Author_Institution :
Inf. & Commun. Univ., Daejeon
fYear :
2007
fDate :
16-19 Oct. 2007
Firstpage :
921
Lastpage :
926
Abstract :
Product line test development is more complicated than the conventional test development for a single application. There were numerous research works in the past that address various issues and aspects that arise in product line testing and test development. However, we still lack a coherent framework that can guide product line test development and link various product line development concepts to relevant product line testing concepts. In this paper we provide a basis for a formal framework for product line test development by linking product line development concepts such as feature, variability, product line architecture, component and use case scenario to product line test concepts such as test architecture, variability for test and test scenario and by providing a systematic way for deriving product line tests, adapting product line tests to a specific product and deriving product specific tests.
Keywords :
program testing; software architecture; software engineering; product line development; product line test development; software development; Application software; Architecture description languages; Automatic testing; Costs; Information technology; Joining processes; Product development; Programming; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Information Technology, 2007. CIT 2007. 7th IEEE International Conference on
Conference_Location :
Aizu-Wakamatsu, Fukushima
Print_ISBN :
978-0-7695-2983-7
Type :
conf
DOI :
10.1109/CIT.2007.40
Filename :
4385203
Link To Document :
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