Title :
ESD excitation model for susceptibility study
Author :
Centola, Federico ; Pommerenke, David ; Kai, Wang ; Van Doren, Thomas ; Caniggia, Spartaco
Author_Institution :
EMC Lab., Missouri Univ., Rolla, MO, USA
Abstract :
The paper provides a simplified model of a known ESD generator that allows modeling the ESD impulses (current and fields) in CST-Microwave Studio. The model is suitable for simulating the excitation of structures by ESD, but it is not intended to predict the fields and current of an ESD generator for its development purpose. The aim is to simultaneously model the ESD generator and a susceptible structure with as few details as possible but to obtain as good a match on current and fields as possible.
Keywords :
circuit simulation; electrostatic devices; electrostatic discharge; integrated circuit modelling; CST-Microwave Studio; ESD excitation model; ESD generator; ESD impulse; electrostatic discharge; numerical modeling; susceptibility study; Current measurement; Electromagnetic modeling; Electronic equipment testing; Electrostatic discharge; Geometry; Numerical models; Predictive models; Relays; Solid modeling; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
DOI :
10.1109/ISEMC.2003.1236564