Title :
The influence of high negative substrate pulse bias on bulk plasma density
Author :
Shuyu Zhang ; Xu Xu ; Rongqing Liang ; Kefu Liu
Author_Institution :
Inst. of Modern Phys., Fudan Univ., Shanghai, China
Abstract :
In this paper, we have used a dual Langmuir probe system to locate the edge of sheath and studied the influence of high negative pulse bias on bulk plasma density. Bulk plasma density changes greatly with and without substrate bias, but is insensitive to different non-zero substrate bias. Pulse width and frequency has greater influence on bulk plasma density, but there is not a simple linear increase between them, inflexion is observed with longer pulse width and higher frequency. We use two competitive interaction mechanisms --ionization cross sections and the secondary electron emission to explain the phenomenon above.
Keywords :
Langmuir probes; electron emission; plasma boundary layers; plasma density; plasma immersion ion implantation; plasma sheaths; Langmuir probe system; bulk plasma density; competitive interaction mechanisms; frequency; inflexion; ionization cross sections; negative substrate pulse bias; nonzero substrate bias; pulse width; secondary electron emission; sheath edge; Coils; Current measurement; Dielectrics; Instruments; Plasma measurements; Plasmas; Substrates;
Conference_Titel :
High Power Particle Beams (BEAMS), 2008 17th International Conference on
Conference_Location :
Xian