DocumentCode :
2142659
Title :
The influence of the source/drain-tie length in a novel self-aligned S/D tie SOI for improving self-heating
Author :
Jyi-Tsong Lin ; Kang, Shiang-Shi ; Eng, Yi-Chuen ; Tseng, Yi-Ming ; Tasi, Ying-Chieh ; Tseng, Hung-Jen ; Jheng, Bao-Tang ; Lin, Po-Hsieh
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, China
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
219
Lastpage :
222
Abstract :
A self-aligned novel S/D tie SOI device is presented for the first time in the field of silicon on insulator technology. The new device having thick-body and body-passway is demonstrated to improve the self-heating effect and decrease the parasitic source/drain resistance. When the source/drain-tie length is too small or too big, the negative differential conductance behavior can be observed. It can be achieved that the lattice temperature of the new device is reduced 32% when compared with the two conventional SOI devices.
Keywords :
MOSFET; silicon-on-insulator; SOI MOSFET; lattice temperature; negative differential conductance; parasitic source-drain resistance; self-aligned S/D tie SOI; self-heating effect; silicon-on-insulator; source-drain-tie length; Delay; Immune system; Lattices; Silicon on insulator technology; Substrates; Sun; Temperature; Thermal conductivity; Threshold voltage; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734511
Filename :
4734511
Link To Document :
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