DocumentCode :
2142707
Title :
Reliability of the aging lead free solder joint
Author :
Ma, Hongtao ; Suhling, Jeffrey C. ; Lall, Pradeep ; Bozack, Michael J.
Author_Institution :
Center for Adv. Vehicle Electron., Auburn Univ., AL
fYear :
0
fDate :
0-0 0
Abstract :
Solder materials demonstrate evolving microstructure and mechanical behavior that changes significantly with environmental exposures such as isothermal aging and thermal cycling. These aging effects are greatly exacerbated at higher temperatures typical of thermal cycling qualification tests for harsh environment electronic packaging. In the current study, mechanical measurements of thermal aging effects and material behavior evolution of lead free solders have been performed. Extreme care has been taken so that the fabricated solder uniaxial test specimens accurately reflect the solder materials present in actual lead free solder joints. A novel specimen preparation procedure has been developed where the solder uniaxial test specimens are formed in high precision rectangular cross-section glass tubes using a vacuum suction process. The tubes are then sent through a SMT reflow to re-melt the solder in the tubes and subject them to any desired temperature profile (i.e. same as actual solder joints). Using specimens fabricated with the developed procedure, isothermal aging effects and viscoplastic material behavior evolution have been characterized for 95.5Sn-4.0Ag-0.5Cu (SAC405) and 96.5Sn-3.0Ag-0.5Cu (SAC305) lead free solders, which are commonly used as the solder ball alloy in lead free BGAs and other components. Analogous tests were performed with 63Sn-37Pb eutectic solder samples for comparison purposes. In our total experimental program, samples have been solidified with both reflowed and water quenching temperature profiles, and isothermal aging has been performed at room temperature (25 degC) and elevated temperatures (100 degC, 125 degC and 150 degC). In this paper, we have concentrated on reporting the results of the room temperature aging experiments. Variations of the temperature dependent mechanical properties (elastic modulus, yield stress, ultimate strength, creep compliance, etc.) were observed and modeled as a function of room temperature aging time.- - Microstructural changes during room temperature aging have also been recorded for the solder alloys and correlated with the observed mechanical behavior changes
Keywords :
ageing; ball grid arrays; copper alloys; eutectic alloys; lead alloys; reflow soldering; reliability; silver alloys; solders; surface mount technology; tin alloys; viscoplasticity; 100 to 150 C; 25 C; SnAgCu; SnPb; ball grid arrays; electronic packaging; eutectic solder; isothermal aging; lead free solder joints; solder ball alloy; solder materials; solder uniaxial test; surface mount technology; thermal aging effects; thermal cycling; vacuum suction; viscoplastic material; Aging; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Isothermal processes; Lead; Microstructure; Performance evaluation; Soldering; Temperature dependence; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645757
Filename :
1645757
Link To Document :
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