DocumentCode :
2142755
Title :
Microstructure and thermal fatigue life of BGAs with eutectic Sn-Ag-Cu balls assembled at 210/spl deg/C with eutectic Sn-Pb solder paste
Author :
Nandagopal, Bala ; Mei, Zequn ; Teng, Sue
Author_Institution :
Cisco Syst. Inc., San Jose, CA
fYear :
0
fDate :
0-0 0
Abstract :
Conventionally, it has been understood that in order to assemble BGAs with eutectic Sn-Ag-Cu solder balls in eutectic Sn-Pb solder paste, a reflow profile having a peak temperature higher than 217degC, which is the melting point of eutectic Sn-Ag-Cu, would be required to achieve complete mixing of the Sn-Pb paste and the Sn-Ag-Cu ball. Nevertheless, it was observed in this study that solder joints with uniform microstructure may be achieved with a peak reflow temperature of about 210degC. For further understanding of this phenomenon, DSC testing was performed on eutectic Sn-Ag-Cu spheres (of 0.406-0.76 mm diameters) placed over eutectic Sn-Pb solder paste of different volumes. It has been observed that the mixing of the Sn-Pb and Sn-Ag-Cu was accomplished in about 15 to 25 sees at a peak temperature of 210degC. Thermodynamic calculations published in the literature indicate that the liquidus temperature of completely mixed Sn-Pb and Sn-Ag-Cu is above 210degC. However, above 205degC the volume ratio of solid phase to liquid phase is very small, or practically negligible. The metallograph of Sn-Pb/Sn-Ag-Cu solder joints reflowed at 210degC peak temperature shows uniform microstructure. However, the distribution of Pb-rich phase inside the alpha Sn for the 210degC reflowed Sn-Pb/Sn-Ag-Cu solder joints was somewhat different from those of the 240degC reflowed Sn-Pb/Sn-Ag-Cu solder joints. Accelerated thermal cycling tests (0-100degC and -40-125degC) have been conducted on CSPs with eutectic Sn-Ag-Cu balls assembled on PCBs (of 0.093" and 0.125" thick) with eutectic Sn-Pb solder paste. SnPb and Pb-free control samples were also included. These parts were assembled in both single and double-sided board configurations and were reflowed with peak temperatures of 210degC and 227deg C. The ATC test results showed that the fatigue life of CSP assemblies reflowed at 210deg C and 227degC had no significant difference
Keywords :
ball grid arrays; chip scale packaging; eutectic alloys; fatigue testing; lead alloys; solders; thermal stress cracking; tin alloys; -40 to 125 C; 0.406 to 0.76 mm; 205 to 240 C; DSC testing; Sn-Ag-Cu; Sn-Pb; ball grid arrays; chip scale packaging; eutectic solder balls; printed circuit board; reflow profile; solder joints; solder paste; thermal cycling tests; thermal fatigue life; Assembly; Fatigue; Microstructure; Performance evaluation; Soldering; Solids; Temperature; Testing; Thermodynamics; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645759
Filename :
1645759
Link To Document :
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