DocumentCode :
2142782
Title :
Design of the AGS Booster ionization profile monitor
Author :
Stillman, A.N. ; Thern, R.E. ; Witkover, R.L. ; Van Zwienen, W.H.
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
fYear :
1991
fDate :
6-9 May 1991
Firstpage :
1189
Abstract :
The Alternating Gradient Synchrotron (AGS) booster ionization profile monitor (IPM) must operate in a vacuum of about 3*10/sup -/0/sup 11/ Torr. The authors present details of the design of the profile monitor. The ultra-high vacuum imposes certain requirements on detector gain and restrictions on construction techniques. Each detector is a two-stage microchannel plate with an integral substrate containing sixty-four printed anodes. Formed electrodes provide uniform collection fields without the use of resistors, which would be unacceptable in these vacuum conditions. An ultraviolet light calibrates the detector in its permanent mounting. An extra set of electrodes performs a first order correction to the perturbations imposed by the horizontal and vertical collection electrodes.<>
Keywords :
particle beam diagnostics; position sensitive particle detectors; proton accelerators; synchrotrons; AGS Booster ionization profile monitor; Alternating Gradient Synchrotron; beam monitoring; collection electrodes; first order correction; particle beam diagnostics; two-stage microchannel plate; Anodes; Detectors; Electrodes; Electrons; Ionization; Microchannel; Monitoring; Structural beams; Vacuum technology; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0135-8
Type :
conf
DOI :
10.1109/PAC.1991.164576
Filename :
164576
Link To Document :
بازگشت