DocumentCode
2142792
Title
Adaptive power gating for function units in a microprocessor
Author
Usami, Kimiyoshi ; Hashida, Tatsunori ; Koyama, Satoshi ; Yamamoto, Tatsuya ; Ikebuchi, Daisuke ; Amano, Hideharu ; Namiki, Mitaro ; Kondo, Masaaki ; Nakamura, Hiroshi
Author_Institution
Shibaura Inst. of Technol., Tokyo, Japan
fYear
2010
fDate
22-24 March 2010
Firstpage
29
Lastpage
37
Abstract
This paper describes adaptive fine-grain control to power gate function units based on temperature dependent break-even time (BET). An analytical model to express the temperature dependent BET is introduced and the accuracy of the model was examined. Results demonstrated that the model well represents the exponential decrease in BET with the temperature. Meanwhile, it was found that the accuracy gets worse at higher temperature and the cause is energy dissipation due to transient glitch at the wakeup. We propose four power-gating policies employing time-based or history-based approaches. Effectiveness in energy savings was evaluated using real design data of four function units in a microprocessor implemented in a 65 nm technology. Results showed that introducing adaptive control to make use of temperature-dependent BET enhances energy savings by up to 21% in the time-based approach and by up to 18% in the history-based approach. The adaptive history-based policy with a limiter outperforms the adaptive time-based policy in energy savings and reduces the total energy of four function units to 11.8% at 100°C as compared to the non-power-gating case.
Keywords
integrated circuit design; microprocessor chips; temperature; adaptive fine grain control; adaptive power gating; energy dissipation; energy saving; gate function unit; microprocessor function unit; size 65 nm; temperature 100 C; temperature dependent break even time; transient glitch; Adaptive control; Agriculture; Analytical models; Central Processing Unit; Circuits; Energy dissipation; Microprocessors; Programmable control; Temperature control; Temperature dependence; Power gating; adaptive; function unit; leakage; temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location
San Jose, CA
ISSN
1948-3287
Print_ISBN
978-1-4244-6454-8
Type
conf
DOI
10.1109/ISQED.2010.5450407
Filename
5450407
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