• DocumentCode
    2142798
  • Title

    Secondary electron emission characteristic of nanocrystalline diamond films

  • Author

    Li Kai ; Jin Xiao ; Gan Kong-yin ; Wang Han-bin ; Hu He-ping

  • Author_Institution
    Inst. of Appl. Electron., Mianyang, China
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The preparation, characterization and application of nanocrystalline diamond films have become a new “hot point” in the development of diamond films prepared by chemical vapor deposition. In this paper, we simply introduced the preparation process of nano-crystalline diamond films with MPCVD method, and the result of surface analysis. Then we designed an experiment device to measure the SEE coefficient(δ) in emission mode. A good result (δ =15) has been obtained.
  • Keywords
    diamond; nanofabrication; nanostructured materials; plasma CVD; secondary electron emission; surface structure; thin films; C; emission mode; nanocrystalline diamond films; plasma enhanced chemical vapor deposition; secondary electron emission; surface analysis; Energy measurement; Gases; Laser modes; Measurement by laser beam; Microwave theory and techniques; US Department of Defense;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Power Particle Beams (BEAMS), 2008 17th International Conference on
  • Conference_Location
    Xian
  • Type

    conf

  • Filename
    6202941