An overview of emerging international measurement standards in electromagnetic compatibility for integrated circuits

Author

Carlton, Ross M.

Author_Institution

Motorola SPS, Austin, TX, USA

Volume

1

fYear

2003

fDate

18-22 Aug. 2003

Firstpage

108

Abstract

The characterization of the electromagnetic compatibility (EMC) performance of integrated circuits (ICs) is receiving increasing focus as new applications and technology trends combine to raise the complexity of EMC compliance. The increased focus is driving the need for standardized measurement procedures to enable comparison of different devices. This paper describes the work in process by IEC TC47/SC47A Working Group 9 to standardize emissions and immunity EMC test methods for integrated circuits. The two standards currently in development for RF radiated and conducted emissions, as well as their status, are discussed.

Keywords

IEC standards; electromagnetic compatibility; integrated circuits; measurement standards; EMC compliance; EMC test methods; IEC TC47/SC47A Working Group 9; RF radiated emissions; conducted emissions; device comparison; electromagnetic compatibility; integrated circuit; integrated circuits; international measurement standards; standardized measurement procedures; Application specific integrated circuits; Circuit testing; Electromagnetic compatibility; Electromagnetic measurements; IEC standards; Immunity testing; Integrated circuit measurements; Integrated circuit technology; Integrated circuit testing; Measurement standards;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2003 IEEE International Symposium on

Print_ISBN

0-7803-7835-0

Type

conf

DOI

10.1109/ISEMC.2003.1236573

Filename

1236573