• DocumentCode
    2142959
  • Title

    The effect of co-planarity variation on anisotropic conductive adhesive assemblies

  • Author

    Dou, Guangbin ; Whalley, David C. ; Liu, Changqing

  • Author_Institution
    Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Anisotropic conductive adhesives (ACAs) consist of a polymer adhesive matrix containing fine conductive particles dispersed either randomly, or more rarely in an ordered way. The primary objective of this experimental research was to understand the effects of a non-uniform bond thickness due to non co-planarity of the component or substrate terminations in ACA assemblies. This has been achieved through measurements of the conductivity variations of ACA joints in a number of ACA assemblies, where the component bump plane and substrate plane were deliberately held in different degrees of relative rotation from parallel during adhesive cure. Measurements of the joint resistances versus rotational angle, for a constant bonding force, were made for 10 levels of rotation of the chips relative to the substrates. The results showed that the resistances of the joints in the assemblies exhibited three distinct types of behaviour: stable joint resistances; gradually increasing resistances and unstable resistances. In conclusion, it is shown that ACA joints are very sensitive to the uniformity of the bond thickness, as the larger the rotations were, the lower and less uniform the joint conductivities were, however, the joints were uniform if the rotation angles were controlled within certain limits
  • Keywords
    adhesive bonding; assembling; electronics packaging; polymers; adhesive cure; anisotropic conductive adhesive assemblies; bump plane; co-planarity variation; conductivity variations; fine conductive particles; joint resistances; nonuniform bond thickness; particle dispersion; polymer adhesive matrix; substrate plane; substrate terminations; Anisotropic magnetoresistance; Assembly; Bonding; Conductive adhesives; Conductivity measurement; Electrical resistance measurement; Force measurement; Polymers; Rotation measurement; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645766
  • Filename
    1645766