• DocumentCode
    2143194
  • Title

    Similarity and Clustering of Footwear Prints

  • Author

    Tang, Yi ; Srihari, Sargur N. ; Kasiviswanathan, Harish

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. at Buffalo, Amherst, NY, USA
  • fYear
    2010
  • fDate
    14-16 Aug. 2010
  • Firstpage
    459
  • Lastpage
    464
  • Abstract
    Research on footwear impression evidence has been gaining increasing importance in forensic science. Given a footwear impression at a crime scene, a key task is to find the closest match in a local/national database so as to determine footwear brand and model. This process is made faster if database prints are grouped into clusters of similar patterns. We describe a clustering approach based on common primitive patterns. Shape features consisting of lines, circles and ellipses are extracted from database prints using variations of the Hough transform. Then an attributed relational graph (ARG) is constructed for each known print, where each node is a primitive feature and each edge represents a spatial relationship between nodes. A footwear print distance (FPD) between ARGs is used as similarity measure. The FPD is computed between each known print and pre-determined patterns to form clusters. The use of the methodology is demonstrated with a large database of known prints.
  • Keywords
    Hough transforms; edge detection; feature extraction; footwear; forensic science; graph theory; pattern clustering; relational databases; ARG; FPD; Hough transform; attributed relational graph; crime scene; edge detection; features extraction; footwear impression; footwear print distance; footwear prints clustering; footwear prints similarity; forensic science; pattern clustering; relational database; Databases; Feature extraction; Footwear; Image edge detection; Pixel; Shape; Transforms; Hough transform; clustering; content-based image retrieval; footwear evidence; similarity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Granular Computing (GrC), 2010 IEEE International Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-7964-1
  • Type

    conf

  • DOI
    10.1109/GrC.2010.175
  • Filename
    5575965