• DocumentCode
    2143230
  • Title

    High-speed bend test method and failure prediction for drop impact reliability

  • Author

    Seah, S.K.W. ; Wong, E.H. ; Mai, Y.W. ; Rajoo, Ranjan ; Lim, Chun Teck

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    The objective of this study is to obtain experimental failure models governing solder joint failure during drop impact testing of board assemblies. A high-speed bend test was developed to perform displacement-controlled bend test of board assemblies at the high flexing frequencies of drop impact. These test frequencies and amplitudes are not achievable by conventional universal testers. Experimental data was obtained for various PCB strain amplitudes, flexural frequencies solder alloys and pad finishes. Results from the high-speed bend tests are used to construct constant amplitude power law fatigue curves. Solder joint reliability found to be dependent on the test frequency, and therefore strain rate. The experimental failure data from these high-speed bend tests are a required basis for a drop impact failure criterion which can take into account frequency and amplitude effects and which is general enough to be applied to product level testing
  • Keywords
    assembling; failure analysis; impact testing; printed circuit testing; reliability; solders; bend test; board assemblies; drop impact reliability; drop impact testing; failure models; failure prediction; pad finishes; product level testing; solder alloys; solder joint reliability; test frequency; Assembly; Capacitive sensors; Electronic equipment testing; Electronics packaging; Environmentally friendly manufacturing techniques; Frequency; Performance evaluation; Plastics; Soldering; Vehicle dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645776
  • Filename
    1645776