DocumentCode
2143317
Title
Manufacturing impedance control for high speed data link applications
Author
Audet, Jean ; Na, Nanju ; Pharand, Sylvain ; Russell, David ; Lévesque, Réjean ; Leclerc, Robert-Paul
Author_Institution
IBM Corp., Bromont, Que.
fYear
0
fDate
0-0 0
Abstract
This paper discusses a new efficient monitoring method for impedance control using statistical impedance distribution generated from physical dimension data on line shape which are collected from manufactured products. In the method, statistical analysis is conducted on physical dimensions using randomly generated simulation data based on manufacturers\´ data, as well as measured data to predict potential impedance tolerance in a manufacturer\´s capability; this is used to "tune" the design accordingly
Keywords
process control; process monitoring; statistical distributions; high speed data link; impedance tolerance; line shape; manufacturing impedance control; monitoring method; physical dimension data; statistical analysis; statistical impedance distribution; Dielectric substrates; Fabrication; Impedance measurement; Industrial control; Monitoring; Packaging; Semiconductor device measurement; Shape control; Statistical analysis; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
1-4244-0152-6
Type
conf
DOI
10.1109/ECTC.2006.1645779
Filename
1645779
Link To Document