• DocumentCode
    2143795
  • Title

    Modeling issues for full-wave numerical EMI simulation

  • Author

    Cracraft, Michael A. ; Ye, Xiaoning ; Wang, Chen ; Chandra, Sunitha ; Drewniak, James L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    18-22 Aug. 2003
  • Firstpage
    335
  • Abstract
    In electromagnetic modeling, agreement between modeling and measurements is a common goal. There are questions that define every model. What is to be modeled? How is it going to be modeled? At what scale is it to be modeled? Through sample results and discussion, this paper addresses some general and some specific elements of model veracity. Through determination, numerical models can certainly be pushed to match any measured results. However, in the end the question that this paper addresses is not necessarily "How good can this model be?" as it is "Is this model good enough?".
  • Keywords
    electromagnetic compatibility; electromagnetic interference; modelling; numerical analysis; simulation; electromagnetic modeling; full-wave EMI simulation; measurement agreement; model veracity; modeling agreement; numerical models; numerical simulation; Computational modeling; Current measurement; Electromagnetic interference; Electromagnetic measurements; Electromagnetic modeling; Finite difference methods; Numerical models; Numerical simulation; Probes; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7835-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2003.1236617
  • Filename
    1236617