Title :
Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model
Author :
Weyl, Thorsten ; Clarke, Dave ; Rinne, Karl
Author_Institution :
Raheen Bus. Park, Limerick, Ireland
Abstract :
This paper introduces a compact FICDM tester model that includes all prominent tester parasitics and discharge arc behaviours. Geometry variations between different Devices Under Test (DUTs) and associated changes in tester capacitances are accounted for. The variation of ground plane capacitances during the approach of the pogo pin towards the DUT and prior to discharge are also modeled. The tester model was verified across an extensive range of test voltages and DUT capacitances.
Keywords :
arcs (electric); capacitance; electron device testing; charged device model; compact tester model; devices under test; discharge arc; dynamic-adaptive field; ground plane capacitances; tester parasitics; Calibration; Capacitance measurement; Circuit testing; Dielectric measurements; Geometry; Parasitic capacitance; Stress; System testing; Thickness measurement; Voltage;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734570
