DocumentCode
2144271
Title
On the design of different concurrent EDC schemes for S-Box and GF(p)
Author
Mathew, J. ; Rahaman, H. ; Jabir, A.M. ; Mohanty, S.P. ; Pradhan, Dhiraj K.
Author_Institution
Dept. of Comput. Sci., Univ. of Bristol, Bristol, UK
fYear
2010
fDate
22-24 March 2010
Firstpage
211
Lastpage
218
Abstract
Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and reliable implementation of cryptographic algorithms in hardware must be able to detect or correct such malicious attacks. Error detection/correction (EDC), through fault tolerance, could be an effective way to mitigate such fault attacks in cryptographic hardware. To this end, we analyze the area, delay, and power overhead for designing the S-Box, which is one of the main complex blocks in the Advanced Encryption Standard (AES), with error detection and correction capability. We use multiple Parity Predictions (PPs), based on various error correcting codes, to detect and correct errors. Various coding techniques are presented, which include simple parity prediction, split parity codes, Hamming, Hsiao, and LDPC codes. The S-Box, GF(p), and PP circuits are synthesized from the specifications, while the decoding and correction circuits are combined to form the complete designs. The analysis shows a comparison of the different approaches characterized by their error detection capability.
Keywords
Hamming codes; cryptography; error correction codes; error detection codes; fault tolerance; parity check codes; EDC schemes; GF(p); Hamming codes; Hsiao codes; LDPC codes; S-Box; advanced encryption standard; cryptographic hardware; error correcting codes; error detection-correction; fault tolerance; malicious attacks; multiple parity predictions; power overhead; split parity codes; Circuit faults; Cryptography; Delay; Error correction; Error correction codes; Fault detection; Fault tolerance; Hardware; Information retrieval; Parity check codes;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location
San Jose, CA
ISSN
1948-3287
Print_ISBN
978-1-4244-6454-8
Type
conf
DOI
10.1109/ISQED.2010.5450467
Filename
5450467
Link To Document