Title :
Global scaling inductor models with temperature effect
Author :
He, Danmy ; Cheng, Jenhao ; Chen, Leo
Author_Institution :
Logic Technol. Dev. Center, SMIC, Shanghai, China
Abstract :
This paper presents global lumped-element circuit models of spiral inductor and differential inductor respectively considering quality factor dependence on temperature. Metal resistance components in equivalent circuits of spiral inductor and differential inductor were adopted to reflect quality factor dependence on temperature in global model. And the global models were shown to give excellent agreement with measured data for inductors of various dimension over temperature range from -40°C to 125°C, which will facilitate customers to design circuits for worst temperature conditions in real world applications.
Keywords :
Q-factor; equivalent circuits; inductors; lumped parameter networks; scaling circuits; differential inductor; equivalent circuits; global scaling inductor models; lumped-element circuit; metal resistance components; quality factor dependence; spiral inductor; temperature -40 degC to 125 degC; temperature effect; Circuits; Electrical resistance measurement; Frequency; Inductors; Parasitic capacitance; Q factor; Spirals; Temperature dependence; Temperature distribution; Temperature measurement;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734578
