• DocumentCode
    2144323
  • Title

    Finite-difference modeling of noise coupling between power/ground planes in multilayered packages and boards

  • Author

    Engin, A. Ege ; Bharath, Krishna ; Swaminathan, Madhavan ; Cases, Moises ; Mutnury, Bhyrav ; Pham, Nam ; De Araujo, Daniel N. ; Matoglu, Erdem

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Multilayered packages and boards, such as high performance server boards, contain thousands of signal lines, which have to be routed on and through several layers with power/ground planes in between. There can be noise coupling not only in the transversal direction through the power/ground planes in such a structure, but also vertically from one plane pair to another through the apertures and via holes. In addition, the continuous increase in power demand along with reduced Vdd values results in significant current requirement for the future chips. Hence, the parasitic effects of the power distribution system become increasingly more critical regarding the signal integrity and electromagnetic interference properties of cost-effective high-performance designs. We present a multilayer finite-difference method (M-FDM), which is capable of characterizing such noise coupling mechanisms. This method allows considering realistic structures, which would be prohibitive to simulate using full-wave simulators
  • Keywords
    equivalent circuits; finite difference methods; integrated circuit design; integrated circuit modelling; integrated circuit packaging; printed circuits; electromagnetic interference; finite-difference modeling; full-wave simulators; multilayer finite-difference method; multilayered boards; multilayered packages; noise coupling; power distribution system; power/ground planes; server boards; signal integrity; signal lines; Apertures; Circuit noise; Coupling circuits; Electromagnetic interference; Finite difference methods; Packaging; Power demand; Power distribution; Semiconductor device noise; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2006. Proceedings. 56th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0152-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2006.1645815
  • Filename
    1645815