Title :
10-Gbps signal propagation of high-density wiring interposer using photosensitive polyimide for 3D packaging
Author :
Kikuchi, Katsuya ; Oosato, Hirotaka ; Ito, Sachiko ; Segawa, Shigemasa ; Nakagawa, Hiroshi ; Tokoro, Kazuhiko ; Aoyagi, Masahiro
Author_Institution :
National Inst. of Adv. Ind. Sci. & Technol., Ibaraki
Abstract :
We have developed a high-density wiring interposer for 10-Gbps signal propagation using a photosensitive polyimide. We optimized the basic properties of the photosensitive polyimide film for the fabrication of the interposer. We experimentally confirmed that the high-density wiring interposer could be fabricated using the optimized polyimide and gold multilayered structure. Fine metal wirings were smoothly covered by the polyimide film, as confirmed by scanning electron microscopy (SEM) of the cross section of the fabricated balanced pair strip-line structure. From the high-resolution differential time domain reflectometry (TDR) measurement, the differential impedance Zdiff of a 12.5-mum-wide 12.4-mm-long balanced-pair strip-line was evaluated to be within 100 Omega plusmn 14.6 %. From the high-resolution differential time domain transmission (TDT) measurement, an insertion loss (S-parameter: S dd21) of -2.96 dB at 10 GHz through the differential strip-line was evaluated. Finally, we confirmed eye diagram measurement at 10 Gbps through the differential strip-line on the fabricated interposer. The aperture size of the measured eye diagram at 10 Gbps was sufficient for ultrahigh-speed signal propagation
Keywords :
integrated circuit interconnections; integrated circuit packaging; microstrip lines; polymer films; scanning electron microscopy; strip line circuits; time-domain reflectometry; 10 GHz; 10 Gbit/s; 100 ohm; 12.4 mm; 12.5 micron; 2.96 dB; 3D packaging; balanced pair stripline; differential impedance; differential stripline; eye diagram measurement; fine metal wirings; insertion loss; photosensitive polyimide; scanning electron microscopy; signal propagation; time domain reflectometry; wiring interposer; Fabrication; Gold; Optical films; Packaging; Polyimides; Reflectometry; Scanning electron microscopy; Signal analysis; Time measurement; Wiring;
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0152-6
DOI :
10.1109/ECTC.2006.1645821