DocumentCode :
2144488
Title :
Fast and accurate BER estimation methodology for I/O links based on extreme value theory
Author :
Cevrero, Alessandro ; Evmorfopoulos, Nestor ; Antoniadis, Charalampos ; Ienne, Paolo ; Leblebici, Yusuf ; Burg, Andreas ; Stamoulis, George
Author_Institution :
School of Computer and Communications Science, EPF Lausanne, 1015, Switzerland
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
503
Lastpage :
508
Abstract :
This paper introduces a novel approach towards the statistical analysis of modern high-speed I/O and similar communication links, which is capable of reliably to determine extremely low (∼10−12 or lower) bit error rates (BER) by using techniques from extreme value theory (EVT). The new method requires only a small amount of voltage values at the received eye center, which can be generated by running circuit/system level simulations or measuring fabricated I/O circuits, to predict link BERs. Unlike conventional techniques, no simplifying assumptions on link noise and interference sources are required making this approach extremely portable to any communication system operating with very low BER. Our experimental results show that the BER estimates from the proposed methodology are on the same order of magnitude as traditional time domain, transient eye diagram simulations for links with BER of 10−6 and 10−5 operating at 9.6 and 10.1 Gbps respectively.
Keywords :
Bismuth; BER; EVT; I/O Links;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.114
Filename :
6513560
Link To Document :
بازگشت