• DocumentCode
    2144714
  • Title

    Real-time and high-speed measurements of charging processes on dielectric surface in vacuum

  • Author

    Suzuki, Kiyoteru ; Kato, Katsumi ; Hakamata, Yoshimi ; Okubo, Hitoshi

  • Author_Institution
    Nagoya Univ., Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    227
  • Lastpage
    230
  • Abstract
    For efficient electrical insulation in vacuum equipment, it is needed to clarify the mechanism of electrostatic charging and resulting discharge processes on a dielectric surface. We investigated charging characteristics on solid dielectrics in vacuum by real-time and high-speed measurement systems. By applying negative DC ramped voltage to the electrode with a cathode triple-junction (TJ), we measured the time transition of surface charge accumulation and current waveforms expressing the electron emission from TJ, by electrostatic probes. From the measurement results, we clarified a steplike charging process and proposed the electron emission model by taking the electric field and its relaxation by charging into account.
  • Keywords
    cathodes; electric current measurement; electron emission; electrostatic devices; electrostatics; flashover; insulation testing; probes; surface charging; vacuum breakdown; cathode triple-junction; dielectric surface; discharge processes; electrical insulation; electron emission model; electrostatic charging; electrostatic probes; high voltage electrical insulation; high-speed measurement systems; insulators; negative DC ramped voltage; real-time measurement systems; relaxation; solid dielectrics; steplike charging process; surface charge accumulation time transition; surface flashover; vacuum equipment; Dielectric measurements; Dielectrics and electrical insulation; Electron emission; Electrostatic measurements; Real time systems; Solids; Surface charging; Surface discharges; Vacuum systems; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2002. 20th International Symposium on
  • Print_ISBN
    0-7803-7394-4
  • Type

    conf

  • DOI
    10.1109/ISDEIV.2002.1027348
  • Filename
    1027348