DocumentCode :
2144940
Title :
Calculation of dielectric strength of the SF6/N2 gas mixture in macroscopically and microscopically non-uniform fields
Author :
Qiu, Y. ; Feng, Y.P.
Author_Institution :
Xi´´an Jiaotong Univ., China
Volume :
1
fYear :
1994
fDate :
3-8 Jul 1994
Firstpage :
87
Abstract :
Dielectric strength of the SF6/N2 gas mixture in a uniform field can be calculated using a simple method assuming there is no interaction between the different component gas molecules. However, to calculate the dielectric strength of the gas mixture in a practical gas-insulated system, both the electrode curvature factor and the electrode surface roughness factor should be taken into account. This paper presents the electrode curvature factors for SF6/N2 in a coaxial electrode system and in a concentric spherical electrode system, and reports the effect of electrode surface roughness on breakdown in the SF6/N2 gas mixture
Keywords :
Application specific processors; Coaxial components; Dielectric breakdown; Dielectric measurements; Electrodes; Equations; Interpolation; Ionization; Length measurement; Q measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
Type :
conf
DOI :
10.1109/ICPADM.1994.413934
Filename :
413934
Link To Document :
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