DocumentCode :
2144951
Title :
Slack allocation for yield improvement in NoC-based MPSoCs
Author :
Meyer, Brett H. ; Hartman, Adam S. ; Thomas, Donald E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2010
fDate :
22-24 March 2010
Firstpage :
738
Lastpage :
746
Abstract :
Yield losses due to a combination of random, systematic and parametric defects are rising as manufacturing processes scale to smaller features sizes. In embedded systems-on-chip, yield can be increased using slack-under-utilization in execution and storage resources-so that when components are defective, data and tasks can be re-mapped and re-scheduled. For any given system, the design space of possible slack allocations is both large and complex, consisting of every possible way to replace each component in the initial system with another from the component library. However, based on the observation that useful slack is often quantized, we have developed an approach that effectively and efficiently allocates execution and storage slack to jointly optimize system yield and cost. While exploring less than 1.62% of the slack allocation design space, our approach consistently outperforms alternative slack allocation techniques to find sets of designs within 4.27% of the yield-cost Pareto-optimal front.
Keywords :
design for manufacture; embedded systems; integrated circuit design; integrated circuit yield; multiprocessing systems; network-on-chip; NoC-based MPSoCs; embedded systems-on-chip; manufacturing processes; multiprocessing system-on-chip; network-on-chip; slack allocation; yield-cost Pareto-optimal front; Circuit optimization; Computer architecture; Cost function; Design optimization; Libraries; Manufacturing processes; Process design; Resource management; Switches; System-level design; System-level design; manufacturability; slack allocation; yield optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4244-6454-8
Type :
conf
DOI :
10.1109/ISQED.2010.5450496
Filename :
5450496
Link To Document :
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