Title :
Multi-degree smoother for low power consumption in single and multiple scan-chains BIST
Author :
Abu-Issa, Abdallatif S. ; Quigley, Steven F.
Author_Institution :
Comput. Syst. Eng. Dept., Birzeit Univ., Birzeit, Palestinian Authority
Abstract :
This paper presents a smoothing technique for the output sequence of linear feedback shift registers (LFSR) to reduce power consumption in test-per-scan built-in self-test (BIST) applications. The proposed smoother is implemented by adding one multiplexer between the LFSR and scan-chain input of a single scan-chain. The size of the multiplexer is determined the desired smoothing degree. When the smoothed sequence of the LFSR is used to feed the test patterns in test-per-scan BIST, it reduces the number of transitions that occur at scan-chain input during scan shift operations by 25% to 50% depending on the smoothing degree, and hence reduces switching activity in the circuit-under-test (CUT) during test application. The proposed technique can be extended to multiple scan-chains BIST, also to test-per-clock applications. Various properties of the proposed technique and the methodology of the design are presented in this paper. Experimental results for the ISCAS´89 benchmark circuits show that the proposed design can reduce the switching activity up to 55% with a negligible effect on the fault coverage and test application time.
Keywords :
automatic test pattern generation; built-in self test; circuit feedback; integrated circuit testing; shift registers; smoothing methods; linear feedback shift register; low power consumption; multi-degree smoother; multiple scan chains BIST; multiplexer; power consumption reduction; scan shift; single scan chains BIST; smoothing technique; test pattern; test per scan built-in self test application; weighted switching activity; Automatic testing; Built-in self-test; Circuit testing; Design methodology; Energy consumption; Feeds; Linear feedback shift registers; Multiplexing; Smoothing methods; Switching circuits; built-in self-test (BIST); linear feedback shift register (LFSR); low power test; scan-based test; single and multiple scan-chains; weighted switching activity (WSA);
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-6454-8
DOI :
10.1109/ISQED.2010.5450502