DocumentCode :
2145224
Title :
Automated silicon debug data analysis techniques for a hardware data acquisition environment
Author :
Yang, Yu-Shen ; Keng, Brian ; Nicolici, Nicola ; Veneris, Andreas ; Safarpour, Sean
Author_Institution :
Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
fYear :
2010
fDate :
22-24 March 2010
Firstpage :
675
Lastpage :
682
Abstract :
Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overcome this challenge by acquiring data in real time. However, trace buffers only provide access to a limited subset of pre-selected signals. In order to effectively debug, it is essential to configure the trace-buffer to trace the relevant signals selected from the pre-defined set. This can be a labor-intensive and time-consuming process. This paper introduces a set of techniques to automate the configuring process for trace buffer-based hardware. First, the proposed approach utilizes UNSAT cores to identify signals that can provide valuable information for localizing the error. Next, it finds alternatives for signals not part of the traceable set so that it can imply the corresponding values. Integrating the proposed techniques with a debugging methodology, experiments show that the methodology can reduce 30% of potential suspects with as low as 8% of registers traced, demonstrating the effectiveness of the proposed procedures.
Keywords :
data acquisition; data analysis; embedded systems; UNSAT cores; automated silicon debug data analysis; buffer-based hardware; debugging methodology; embedded hardware; hardware data acquisition environment; preselected signals; trace buffers; Data acquisition; Data analysis; Debugging; Hardware; Integrated circuit synthesis; Modems; Prototypes; Registers; Silicon; Time to market; Silicon debug; data acquisition setup; post-silicon diagnosis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location :
San Jose, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4244-6454-8
Type :
conf
DOI :
10.1109/ISQED.2010.5450506
Filename :
5450506
Link To Document :
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