DocumentCode :
2145266
Title :
Influence of Sn grain size and orientation on the thermomechanical response and reliability of Pb-free solder joints
Author :
Bieler, T.R. ; Jiang, H. ; Lehman, L.P. ; Kirkpatrick, T. ; Cotts, E.J.
Author_Institution :
Mater. Sci. & Chem. Eng., Michigan State Univ., East Lansing, MI
fYear :
0
fDate :
0-0 0
Abstract :
The size and orientation of Sn grains in Pb-free, near eutectic SAC solder joints were examined. A clear dependence of the thermomechanical response of these solder joints on Sn grain orientation was observed. Solder balls with Sn grains of particular orientation (a-axis perpendicular to the substrate) were observed to fail before neighboring balls with different orientations. This results from the fact that the coefficient of thermal expansion of Sn along the a-axis is half the value along the c-axis; joints observed to be damaged had maximum mismatch in the coefficient of thermal expansion between solder and substrate at the joint interface, as well as tensile stress modes during the hot part of the cycle
Keywords :
circuit reliability; grain size; soldering; solders; thermal expansion; tin alloys; Sn; eutectic SAC solder joints; grain size; lead-free solder joints; solder balls; thermomechanical reliability; thermomechanical response; Anisotropic magnetoresistance; Grain size; Lead; Materials science and technology; Microstructure; Soldering; Thermal expansion; Thermal stresses; Thermomechanical processes; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645849
Filename :
1645849
Link To Document :
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