DocumentCode
2145428
Title
A negotiated congestion based router for simultaneous escape routing
Author
Ma, Qiang ; Yan, Tan ; Wong, Martin D F
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2010
fDate
22-24 March 2010
Firstpage
606
Lastpage
610
Abstract
The negotiated congestion based routing scheme finds success in FPGA routing and IC global routing. However, its application in simultaneous escape routing, a key problem in PCB design, has never been reported in previous literature. In this paper, we investigate how well the negotiated congestion based router performs on escape routing problems. We propose an underlying routing graph which correctly models the routing resources of the pin grids on board. We then build a Negotiated Congestion based Escape Router (NCER) by applying the negotiated congestion routing scheme on the constructed routing graph. We compare the performance of NCER with that of Cadence PCB router Allegro on 14 industrial test cases, and experimental results show that the two routers have comparable routability: each of them completely routes 7 test cases. Moreover, we observe that NCER and Allegro exhibit complementary behaviors: each is able to solve most of the test cases that the other cannot solve. Together, they completely route 11 test cases. Therefore, by using NCER as a supplement to Allegro, we can solve a broader range of escape routing problems.
Keywords
electronics packaging; graph theory; network routing; printed circuit design; Cadence PCB router Allegro; FPGA routing; IC global routing; PCB design; negotiated congestion based escape router; pin grids; routing graph; simultaneous escape routing; Application software; Circuit testing; Design automation; Field programmable gate arrays; Integrated circuit modeling; Laboratories; Pins; Printed circuits; Routing; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location
San Jose, CA
ISSN
1948-3287
Print_ISBN
978-1-4244-6454-8
Type
conf
DOI
10.1109/ISQED.2010.5450514
Filename
5450514
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