• DocumentCode
    2145428
  • Title

    A negotiated congestion based router for simultaneous escape routing

  • Author

    Ma, Qiang ; Yan, Tan ; Wong, Martin D F

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2010
  • fDate
    22-24 March 2010
  • Firstpage
    606
  • Lastpage
    610
  • Abstract
    The negotiated congestion based routing scheme finds success in FPGA routing and IC global routing. However, its application in simultaneous escape routing, a key problem in PCB design, has never been reported in previous literature. In this paper, we investigate how well the negotiated congestion based router performs on escape routing problems. We propose an underlying routing graph which correctly models the routing resources of the pin grids on board. We then build a Negotiated Congestion based Escape Router (NCER) by applying the negotiated congestion routing scheme on the constructed routing graph. We compare the performance of NCER with that of Cadence PCB router Allegro on 14 industrial test cases, and experimental results show that the two routers have comparable routability: each of them completely routes 7 test cases. Moreover, we observe that NCER and Allegro exhibit complementary behaviors: each is able to solve most of the test cases that the other cannot solve. Together, they completely route 11 test cases. Therefore, by using NCER as a supplement to Allegro, we can solve a broader range of escape routing problems.
  • Keywords
    electronics packaging; graph theory; network routing; printed circuit design; Cadence PCB router Allegro; FPGA routing; IC global routing; PCB design; negotiated congestion based escape router; pin grids; routing graph; simultaneous escape routing; Application software; Circuit testing; Design automation; Field programmable gate arrays; Integrated circuit modeling; Laboratories; Pins; Printed circuits; Routing; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2010 11th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4244-6454-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2010.5450514
  • Filename
    5450514