• DocumentCode
    2145560
  • Title

    A low cost conversion of semi-anechoic chamber to fully-anechoic chamber for RF antenna measurements

  • Author

    Kinezos, C. ; Ungvichian, Vichate

  • Author_Institution
    Dept. of Electr. Eng., Florida Atlantic Univ., Boca Raton, FL, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    18-22 Aug. 2003
  • Firstpage
    724
  • Abstract
    The commonly use of semi-anechoic chambers (SAC) is for electromagnetic interference emission (EMI) measurements. This paper suggests a simple technique to extend the EMI chamber capability to a low-cost fully anechoic chamber (FAC) to characterize the antenna performance. The dimensions of the absorbing cones placed o the reflecting ground surface are based on the Fresnel´s zone concept. The receiving antenna operating from 300 MHz to 1 GHz is best located at the corner of the chamber. With the available 2´ absorbing cones, the maximum distance between transmitting and receiving antenna of 4.5 meters, and the far-field criteria, the applicable antenna pattern measurement at 300 MHz requires only about 80% of the first Fresnel´s zone cone coverage. Within the 0.5×0.5 m2 area, at 60 MHz the worst case field uniformity is about 1.4 dB.
  • Keywords
    anechoic chambers (electromagnetic); antenna radiation patterns; antenna testing; electromagnetic compatibility; electromagnetic interference; 0.3 to 1 GHz; 4.5 m; EMI measurements; Fresnel zone; RF antenna measurements; absorbing cones; antenna pattern measurement; antenna performance; electromagnetic interference emission; far-field criteria; field uniformity; fully-anechoic chamber; pyramidal absorbers; reflecting ground surface; semianechoic chamber; Antenna measurements; Costs; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Fresnel reflection; Radio frequency; Receiving antennas; Research and development; Transmitting antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7835-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2003.1236696
  • Filename
    1236696