DocumentCode
2145561
Title
A cost-effective selective TMR for heterogeneous coarse-grained reconfigurable architectures based on DFG-level vulnerability analysis
Author
Imagawa, Takashi ; Tsutsui, Hiroshi ; Ochi, Hiroyuki ; Sato, Takashi
Author_Institution
Graduate School of Informatics, Kyoto University, Japan
fYear
2013
fDate
18-22 March 2013
Firstpage
701
Lastpage
706
Abstract
This paper proposes a method to determine a priority for applying selective triple modular redundancy (selective TMR) against single event upset (SEU) to achieve cost-effective reliable implementation of an application circuit to a coarse-grained reconfigurable architecture (CGRA). The priority is determined by an estimation of the vulnerability of each node in the data flow graph (DFG) of the application circuit. The estimation is based on a weighted sum of the features and parameters of each node in the DFG which characterize impact of the SEU in the node to the output data. This method does not require time-consuming placement-and-routing processes, as well as extensive fault simulations for various triplicating patterns, which allows us to identify the set of nodes to be triplicated for minimizing the vulnerability under given area constraint at the early stage of design flow. Therefore, the proposed method enables us efficient design space exploration of reliability-oriented CGRAs and their applications.
Keywords
Reliability; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.151
Filename
6513597
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