• DocumentCode
    2145561
  • Title

    A cost-effective selective TMR for heterogeneous coarse-grained reconfigurable architectures based on DFG-level vulnerability analysis

  • Author

    Imagawa, Takashi ; Tsutsui, Hiroshi ; Ochi, Hiroyuki ; Sato, Takashi

  • Author_Institution
    Graduate School of Informatics, Kyoto University, Japan
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    701
  • Lastpage
    706
  • Abstract
    This paper proposes a method to determine a priority for applying selective triple modular redundancy (selective TMR) against single event upset (SEU) to achieve cost-effective reliable implementation of an application circuit to a coarse-grained reconfigurable architecture (CGRA). The priority is determined by an estimation of the vulnerability of each node in the data flow graph (DFG) of the application circuit. The estimation is based on a weighted sum of the features and parameters of each node in the DFG which characterize impact of the SEU in the node to the output data. This method does not require time-consuming placement-and-routing processes, as well as extensive fault simulations for various triplicating patterns, which allows us to identify the set of nodes to be triplicated for minimizing the vulnerability under given area constraint at the early stage of design flow. Therefore, the proposed method enables us efficient design space exploration of reliability-oriented CGRAs and their applications.
  • Keywords
    Reliability; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.151
  • Filename
    6513597