DocumentCode :
2145684
Title :
On-line testing of permanent radiation effects in reconfigurable systems
Author :
Cassano, Luca ; Cozzi, Dario ; Korf, Sebastian ; Hagemeyer, Jens ; Porrmann, Mario ; Sterpone, Luca
Author_Institution :
Department of Information Engineering, University of Pisa, Italy
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
717
Lastpage :
720
Abstract :
Partially reconfigurable systems are more and more employed in many application fields, including aerospace. SRAM-based FPGAs represent an extremely interesting hardware platform for this kind of systems, because they offer flexibility as well as processing power. In this paper we report about the ongoing development of a software flow for the generation of hard macros for on-line testing and diagnosing of permanent faults due to radiation in SRAM-FPGAs used in space missions. Once faults have been detected and diagnosed the flow allows to generate fine-grained patch hard macros that can be used to mask out the discovered faulty resources, allowing partially faulty regions of the FPGA to be available for further use.
Keywords :
Circuit faults; Fabrics; Field programmable gate arrays; Generators; Software; Test pattern generators; Automatic Test Pattern Generation; Fault Diagnosis; On-Line Testing; Permanent Radiation Effects; SRAM-FPGA;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.154
Filename :
6513600
Link To Document :
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