• DocumentCode
    2145765
  • Title

    Synthesis of indium phosphide polycrystalline

  • Author

    Sun, Niefeng ; Mao, Luhong ; Sankaranarayanan, K. ; Zhou, Xiaolong ; Guo, Weilian ; Wu, Xiawan ; Sun, Tongnian

  • Author_Institution
    Sch. of Electron. Inf. Eng., Tianjin Univ., Tianjin, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    734
  • Lastpage
    737
  • Abstract
    A large quantity of high purity InP crystal material has been produced by the phosphorus in-situ injection synthesis. In the injection method, phosphorus reacts with indium very quickly so that the rapid polycrystalline synthesis is possible. The injection speed, melt temperature, phosphorus excess, and so on are also important for a successful synthesis process. About 3200-4800 g stoichiometric high purity poly InP is synthesized reproducibly by improved P-injection method in the high-pressure puller. Twin-Free InP single crystals with diameter of 50-110 mm can be pulled after the synthesis. In the present work, the characterization of InP polycrystalline was studied by van der Pauw method, GDMS, and PL.
  • Keywords
    III-V semiconductors; crystal growth from melt; indium compounds; materials preparation; photoluminescence; semiconductor growth; stoichiometry; GDMS; InP; crystal growth; high-pressure puller; indium phosphide polycrystalline; injection method; liquid encapsulated Czochralski method; melt temperature; phosphorus in-situ injection synthesis; photoluminescence; size 50 mm to 110 mm; stoichiometry; twin-free single crystals; van der Pauw method; Cooling; Crystalline materials; Crystals; Impurities; Indium phosphide; Land surface temperature; Semiconductor materials; Sun; Synthesizers; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734636
  • Filename
    4734636