DocumentCode :
2145785
Title :
Testing for SoCs with advanced static and dynamic power-management capabilities
Author :
Kavousianos, Xrysovalantis ; Chakrabarty, Krishnendu
Author_Institution :
Department. of Computer Science, University of Ioannina, Greece
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
737
Lastpage :
742
Abstract :
Many multicore chips today employ advanced power management techniques. Multi-threshold CMOS (MTCMOS) is very effective for reducing standby leakage power. Dynamic voltage scaling and voltage islands which operate at multiple power-supply voltage levels, minimize dynamic power consumption. Effective defect screening for such chips requires advanced test techniques that target defects in the embedded cores and the power management structures. We describe recent advances in test generation and test scheduling techniques for SoCs that support power switches, voltage islands, and dynamic voltage scaling schemes.
Keywords :
Built-in self-test; Radiation detectors; System-on-chip; Transistors; Voltage control; Voltage-controlled oscillators; Dynamic power; SoC test scheduling; dynamic voltage scaling; power switches; static power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.158
Filename :
6513604
Link To Document :
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