• DocumentCode
    2146200
  • Title

    A test sequence generation scheme satisfying the completeness criteria

  • Author

    Son, HongSe ; Nyang, DaeHun ; Park, JinHo ; Lim, SangYong ; Chin, ByungMoon ; Lee, JunWon ; Song, JooSeok

  • Author_Institution
    Electron. & Telecommun. Res. Inst., Taejeon, South Korea
  • Volume
    2
  • fYear
    1997
  • fDate
    20-22 Aug 1997
  • Firstpage
    560
  • Abstract
    We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example
  • Keywords
    automatic test software; conformance testing; fault diagnosis; finite state machines; program testing; protocols; sequences; telecommunication computing; UIO sequence; characterization sequences; completeness criteria; k-strong FSM; output fault; test sequence generation scheme; Automatic testing; Computer science; Electronic equipment testing; Fault detection; Fault tolerance; Protocols; Sections;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Computers and Signal Processing, 1997. 10 Years PACRIM 1987-1997 - Networking the Pacific Rim. 1997 IEEE Pacific Rim Conference on
  • Conference_Location
    Victoria, BC
  • Print_ISBN
    0-7803-3905-3
  • Type

    conf

  • DOI
    10.1109/PACRIM.1997.620325
  • Filename
    620325