DocumentCode
2146200
Title
A test sequence generation scheme satisfying the completeness criteria
Author
Son, HongSe ; Nyang, DaeHun ; Park, JinHo ; Lim, SangYong ; Chin, ByungMoon ; Lee, JunWon ; Song, JooSeok
Author_Institution
Electron. & Telecommun. Res. Inst., Taejeon, South Korea
Volume
2
fYear
1997
fDate
20-22 Aug 1997
Firstpage
560
Abstract
We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example
Keywords
automatic test software; conformance testing; fault diagnosis; finite state machines; program testing; protocols; sequences; telecommunication computing; UIO sequence; characterization sequences; completeness criteria; k-strong FSM; output fault; test sequence generation scheme; Automatic testing; Computer science; Electronic equipment testing; Fault detection; Fault tolerance; Protocols; Sections;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Computers and Signal Processing, 1997. 10 Years PACRIM 1987-1997 - Networking the Pacific Rim. 1997 IEEE Pacific Rim Conference on
Conference_Location
Victoria, BC
Print_ISBN
0-7803-3905-3
Type
conf
DOI
10.1109/PACRIM.1997.620325
Filename
620325
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